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<h2>CGH Report Guide</h2>

<p> Diffraction International designs and analyzes aspheric null tests using OSLO 
SIX optical design software. This software was selected because it can be programmed 
to automate much of the design and documentation process and has few hard limits 
on array sizes, etc. Much of the design documentation is generated by standard 
OSLO commands and proprietary OSLO CCL programs. CGH encoding and digitization 
are performed using Diffraction International's proprietary HoloMask software. 
Both OSLO and HoloMask can generate AutoCAD compatible graphic data. </p>
<hr />
<h4><a href="#Summary">SUMMARY</a></h4>
<ul>
<li><a href="#CofC">Certificate of Compliance</a></li>
<li><a href="#Instruct">Instructions for Use</a></li>
<li><a href="#Config">Test configuration diagram</a></li>
<li><a href="#Aperture">CGH aperture layout</a></li>
<li><a href="#Box">Box label</a></li>
</ul>
<h4><a href="#Design">DESIGN</a></h4>
<ul>
<li><a href="#Raytrace">Double pass raytrace model</a></li>
<li><a href="#fourpane">Aspheric departure and beam footprint diagram</a></li>
<li><a href="#Sag">Asphere sag table</a></li>
<li><a href="#Phase">CGH phase table</a></li>
</ul>
<h4><a href="#Analysis">ANALYSIS</a></h4>
<ul>
<li><a href="#Morph">Pupil mapping analysis</a></li>
<li><a href="#Ghost">Ghost diffraction analysis</a></li>
<li><a href="#Sensitivity">Sensitivity analysis</a></li>
<li><a href="#Tol">Tolerance analysis</a></li>
</ul>
<h4><a href="#Verification">VERIFICATION AND CERTIFICATION</a></h4>
<ul>
<li><a href="#Nikon">Nikon verification of registration</a></li>
<li><a href="#Substrate">Substrate interferograms before patterning</a></li>
<li><a href="#TWD">Zero-order interferograms before phase etch</a></li>
<li><a href="#RIE">Zero-order interferograms after phase etch</a></li>
<li><a href="#Framing">Framing certification</a></li>
</ul>
<h4><a href="#Appendices">ELECTRONIC APPENDICES</a></h4>
<ul>
<li><a href="#OSLO">OSLO lens file</a></li>
<li><a href="#ZEMAX">ZEMAX lens files</a></li>
<li><a href="#CodeV">CodeV lens files</a></li>
<li><a href="#DXF">AutoCAD DXF double-pass lens file</a></li>
<li><a href="#HoloMask">HoloMask log file</a></li>
<li><a href="#EdgeChk">EdgeChk verification of encoding and digitization</a></li>
<li><a href="#TolXLS">Tolerance analysis spreadsheet</a></li>
<li><a href="#OPD">Durango interferogram files</a></li>
</ul>
<hr />
<h3 id="Summary">SUMMARY</h3>
<h4 id="CofC">Certificate of Compliance</h4>
<p> This certifies that the CGH null meets all specifications of your purchase 
order and associated documentation as well as Diffraction International's own 
specifications. Any exceptions are noted. </p>

<h4 id="Instruct">Instructions for Use </h4>
<p>These customized instructions should enable anyone experienced in interferometry 
to use the CGH null to perform an aspheric null test. </p>

<h4 id="Config">Test configuration diagram </h4>
<p>This oblique view shows the null test configuration with the CGH on the left 
and the test beam propagating to the right. The CGH coordinate axes and frame 
orientation are shown. If the scale is such that these are difficult to see, then 
this information is repeated in an enlarged view at the upper left of the drawing. 
</p>

<h4 id="Aperture">CGH aperture layout </h4>
<p>These diagrams show the apertures of the CGH null and the Alignment CGH (if 
any). The null aperture is the actual CGH null. A "retro" aperture diffracts the 
test wavefront back on itself to create a null interferogram and serves as an 
aid in aligning the CGH. HA50 Series Alignment CGHs consist entirely of retro 
apertures with the relevant ones shaded. An "autocollimation" aperture produces 
a collimated wavefront, usually perpendicular to some planar feature on the test 
optic. It is used to align the test optic tilt and tip independent of the centration 
and focus. A "vertex" aperture focuses light onto the test optic vertex to serve 
as a coarse centration aid. </p>

<h4 id="Box">Box label </h4>
<p>The box label is provided as an aid in identifying the correct CGH null. With 
experience, the information on the label is sufficient for positioning the CGH 
relative to the interferometer.</p>

<hr />
<h3 id="Design">DESIGN </h3>
<h4 id="Raytrace">Double-pass raytrace model </h4>
<p>This is a partial tabulation of the OSLO double pass raytrace model; the complete 
lens file is included as an electronic appendix. The raytrace model begins and 
ends with a focused or collimated wavefront. The CGH is modeled as two superimposed 
surfaces labeled CGH Carrier and CGH Phase. The interferometer optics are not 
modeled. This listing concludes with a tabulation of vertex coordinates with respect 
to the CGH face and with respect to the test optic. </p>

<h4 id="fourpane">Aspheric departure and beam footprint diagram </h4>
<p>This four quadrant diagram summarizes the null test geometry. The upper left 
quadrant shows the asphere departure in test wavelengths (usually 632.82 nm) from 
a "best fit" sphere, versus radial coordinate in lens units. The best fit sphere 
is here defined as matching the asphere at the vertex and edge. A dashed curve 
represents spherical extrapolation of the asphere vertex radius. A dashed vertical 
line, when present, indicates the clear aperture limit. </p>

<p>The upper right quadrant shows the null test configuration beginning on the 
left with a wavefront perpendicular to the return surface (usually the asphere) 
and ending with a spherical or collimated wavefront after the CGH. The P-V and 
RMS design residuals are reported. The interferometer optics are not shown. </p>

<p>The lower left quadrant shows a square grid representing the design aperture 
footprint on the test optic. Any grid points which appear as red X's are vignetted 
later in the raytrace, such as by an undersized CGH. </p>

<p>The lower right quadrant shows the design aperture footprint on the CGH and 
the shape of the CGH fringe pattern. Each plotted fringe represents several actual 
fringes (or line pairs) as noted. Also given are the F/# and location relative 
to the CGH of the spherical or plano test wavefront. If a negative value is given 
for Z<sub>0</sub>, then the CGH is in a converging spherical wavefront. The polynomial degree 
of the CGH phase function is noted.</p>

<h4 id="Sag">Asphere sag table </h4>
<p>The asphere sag table is generated by the OSLO software. It serves as a check 
on whether we have properly modeled your asphere. We will choose the aperture 
increments to match any sag table supplied with the asphere specification. </p>

<h4 id="Phase">CGH phase table </h4>
<p>The CGH phase table is generated by the OSLO software. The CGH fringes are 
contours of equal phase and one unit of phase represents one fringe. Our sign 
convention follows a thin lens analogy in that diffracted light is bent toward 
regions of higher phase value.</p>

<hr />
<h3 id="Analysis">ANALYSIS</h3>

<h4 id="Morph">Pupil mapping analysis (table and equations) </h4>
<p>The pupil mapping table traces a grid or fan of rays from the test pupil to 
the test optic surface, to the CGH face, and then on to the spherical or collimated source.</p>

<p>In the case of a spherical source, ray coordinates after the CGH are specified by their direction cosines. Direction cosines are accurately scalable to image coordinates, assuming your interferometer has well-corrected imaging optics and the interferometer axis is correctly aimed (usually perpendicular to CGH face). </p>

<p>The pupil mapping table also given in the form of polynomial equations that 
transform between test optic coordinates, CGH coordinates, and exit pupil direction cosines. There are usually six sets of transformation equations. The most useful of these are CGH-to-image, asphere-to-image and image-to-asphere. Our Durango Interferometry Software fully supports pupil mapping through its morphing feature.</p>

<h4 id="Ghost">Ghost diffraction analysis (diagram and table) </h4>
<p>The ghost diffraction analysis consists of a 4-panel diagram and an associated 
table. The visibility of ghosts (and also the test wavefront) depends on the diffraction 
efficiencies of the CGH, the reflectivity of the test optic, and the field of 
view (FOV) of your interferometer.</p>

<p> The ghost analysis will generally assume that your interferometer has a FOV 
of ±500 tilt fringes. The actual angular FOV can be determined by testing a flat 
mirror and noting how much tilt is required to cause the interferogram to go dark-the 
interferometer's full angular FOV is equal to the maximum mirror tilt. Zoom position 
may affect your interferometer's FOV. For spherical test wavefronts, the linear 
FOV is equal to the angular field of view (in radians) multiplied by the focal 
length of the Fizeau sphere or equivalent accessory optic. If the CGH is located 
in a diverging spherical test wavefront, you can reduce the FOV by placing an 
aperture flag at the focus. This will be noted in the Instructions for Use. </p>

<p>If the test wavefront converges to a real focus between the CGH and the test 
optic, then the upper left panel shows a spot diagram of the various diffraction 
orders at this focal plane as seen from the interferometer side. The zero order 
diffraction is black, marked by a "+" symbol, and will remain if the CGH is removed. 
The desired first order diffraction is green and other diffraction orders are 
red. A black circle represents the recommended pinhole spatial filter size and 
location to pass the green first order wavefront. </p>

<p>Otherwise, the upper left panel is a raytrace of the various ghosts resulting 
from three incident rays at fractional pupil coordinates 0.0 and (0.7. The interferometer 
is not shown but would be located to the right. The test wavefront rays are shown 
in green, transmitted ghosts are red, and reflected ghosts are blue. </p>

<p>The upper right panel shows a spot diagram of the various diffraction orders 
as they appear (or would appear) at the cat's eye focus of the interferometer. 
This diagram can be useful when aligning the test optic to select the correct 
diffraction order. In the case of a convex test optic or afocal configuration, 
the focus is virtual or at infinity but may be observed by placing the interferometer 
into alignment mode. Black dots represent the zero order transmitted ghost which 
remains (and gets brighter) if the CGH is removed. Other ghosts transmitted by 
the CGH are represented by red dots. Ghosts reflected by the CGH are represented 
by blue dots. A black circle indicates the field of view specified for the ghost 
analysis. The focal plane diagram is plotted using CGH coordinates, therefore 
the FOV circle is decentered for off-axis CGH nulls. The test wavefront is perfectly 
focused and would appear as a single dot in the center of the FOV circle, so it 
is instead represented by a green '+' symbol. </p>

<p>The lower left panel shows a spot diagram pupil map of the test wavefront as 
it returns through the CGH. The density of dots is linearly scaled to represent 
intensity with 100,000 dots over the full circular pupil corresponding to full 
intensity of the test beam. A key shows four decades of intensity. </p>

<p>The lower right panel shows a spot diagram pupil map of CGH diffraction ghosts. 
Only rays within the specified FOV circle are plotted. The dot density again represents 
intensity and can be graphically compared to the test wavefront intensity. Red 
dots represent ghost rays which are transmitted by the CGH and diffracted (wrongly) 
once or twice. These ghosts can be blocked (temporarily) by inserting a card immediately 
after the CGH. Black dots represent the zero order transmission ghost which remains 
when the CGH is removed. Blue dots represent rays which are reflected by the CGH. 
These rays will remain even if the test optic is blocked. </p>

<p>A table lists each combination of diffraction orders which can propagate through 
the CGH, to the test optic and back through the CGH to the interferometer. First 
order diffraction, highlighted by an arrow, is the test wavefront of interest. 
It has nominally zero tilt or residual aberration. All other combinations of diffraction 
orders are unwanted ghosts which must be sufficiently tilted, aberrated or vignetted 
to prevent their being viewed in the interferogram. </p>

<p>The columns labeled "Out" and "Back" represent the diffraction orders for each 
pass through the CGH. Subsequent columns report the wavefront residual and tilt 
for this combination of diffraction orders. The column labeled "%inFOV" indicates 
the fraction of the test or ghost beam which returns unvignetted through the CGH 
and within the assumed FOV. Ghost beams may be vignetted by the interferometer 
optics or by an aperture flag at the cat's eye focus. Note that improper test 
optic alignment can sometimes cause a ghost beam to be nearly nulled and the test 
beam to be tilted and aberrated. </p>

<p>The column labeled "Return" represents the fraction of the outgoing test wavefront 
intensity returned to the interferometer through this diffraction channel, based 
on theoretical or measured values of the CGH diffraction efficiency and test optic 
reflectivity. Usually, a test wavefront return of 0.035 is desired to match an 
uncoated Fizeau reference surface reflectivity of 0.035. Note that, in the case 
of a chrome type CGH, the first order test beam does not have the strongest return. 
The spot diagrams are a better indicator of visibility since the ghosts are generally 
not well focused. </p>

<p>Generally, the ghosts corresponding to diffraction order combinations &minus;1,+3 
and +3,&minus;1 are the most troublesome. They can interfere with each other to form 
low spatial frequency fringes even if tilted significantly with respect to the 
test beam. The other "2-sum" ghosts corresponding to diffraction order combinations 
0,2 and 2,0 are less visible because of their lower diffraction efficiencies, 
particularly in the case of phase gratings. </p>

<p>Following the transmission ghosts is a listing of reflection ghosts corresponding 
to diffraction orders which reflect off the CGH and back into the interferometer. 
This are usually negligible for phase type CGHs. </p>

<p>Diffraction International attempts to eliminate all significant ghosts from 
the test configuration by manipulating the CGH location and CGH carrier, and by 
recommending the use of aperture flags and/or phase type CGHs where appropriate. 
Nonetheless, every interferometer and asphere null test configuration is unique 
and we continue to learn from experience. If you encounter a problem with ghosts, 
please let us know and we will work with you to resolve it. If the interferometer 
field of view and test optic reflectivity used for the ghost analysis do not accurately 
represent your configuration, we will gladly repeat the analysis. </p>

<h4 id="Sensitivity">Sensitivity analysis (table and synthetic interferograms) 
</h4>
<p>The double pass sensitivity analysis is generated by Diffraction International's 
proprietary OSLO CCL software. The documentation begins with a listing of the 
lens surfaces for identification purposes. The surface numbering will be different 
than for the single pass model. A notation "GC 1" in the tilt/decenter data indicates 
that the surface is specified in global coordinates relative to surface 1¾usually 
the CGH face. The list of variables defines compensators; these typically consist 
of the focus, decentration and tilt of the test optic (usually expressed relative 
to the CGH). The variables follow OLSO notation. </p>

<p>The interferogram P-V and RMS are determined by tracing a dense bundle of rays 
(typically &gt;7500) to the cat's eye focus position or, in the case of an afocal 
system, to the CGH face. Relevant design parameters are perturbed one at a time, 
the compensators are varied to minimize the RMS wavefront error while maintaining 
zero tilt fringes, and the residual P-V and RMS wavefront error and the required 
compensator values are reported. If the optimization would cause a compensator 
value to violate imposed limits, then its value is reported as MIN or MAX. </p>
<p>When a compensator is perturbed, it is temporarily removed from the null optimization. 
</p>

<p>Retrace errors can occur if the interferometer test wavefront departs from 
its spherical or collimated ideal or if the test wavefront is not concentric with 
the Fizeau sphere or parallel to the Fizeau flat. Sensitivity to retrace errors 
can be determined by including the Fizeau reference surface in the model, then 
adding Zernike phase perturbations to the wavefront at the first encounter with 
the Fizeau surface and then removing identical perturbations on the return pass. 
</p>

<p>Transmitted wavefront distortion of a Fizeau interferometer and accessory optics 
is commonly a fringe or more for a fast Fizeau sphere. If the test configuration 
shows sensitivity to wavefront tilt (Zernikes #1 and #2), then, rather than relying 
on alignment mode, it is better to check Fizeau sphere tilt and tip in cat's eye 
configuration or Fizeau flat tilt and tip against a corner cube reflector. If 
the test configuration shows sensitivity to wavefront power (Zernike #3), then 
interferometer collimation can be checked with a shear plate and, if the interferometer 
is properly collimated, Fizeau sphere concentricity error can be tested in transmission 
against a Fizeau flat. </p>

<p>Alignment of the interferometer relative to the test configuration is modeled 
by varying the location of the point or collimated source. For focal configurations 
there are three degrees of freedom corresponding to the X,Y,Z location of the 
cat's eye focus. For afocal configurations the degrees of freedom are tilt and 
tip, expressed as interferogram fringes over the frame aperture. </p>

<p>CGH substrate meniscus is expressed in fringes over the frame aperture. CGH 
substrate power and wedge are expressed in fringes over the clear aperture. </p>

<p>One parameter, CGH pattern distortion, is treated differently because it cannot 
be readily modeled. The CGH aperture is uniformly sampled and the effect of a 
localized 1 micron error in pattern placement is computed based on the local grating 
spatial frequency. These samples are combined statistically to yield P-V and RMS 
wavefront errors. </p>

<p>Synthetic interferograms supplement the printed sensitivity analysis. For each 
perturbed parameter for which the residual wavefront error is large enough to 
yield an informative plot, a synthetic residual interferogram is plotted. A label 
at the top of each synthetic interferogram gives the parameter name, design value 
and perturbation increment. These exactly match columns 1 through 3 of the sensitivity 
analysis. The synthetic interferograms can be of considerable use in understanding 
and nulling observed interferograms. </p>

<h4 id="Tol">Tolerance analysis </h4>
<p>The tolerance analysis is derived primarily from the sensitivity analysis which 
is summarized in columns 5 through 7. The reference surface is generally assigned 
a tolerance of 0.1 wave if spherical or 0.05 waves if plano. Design parameters 
of the test optic are assigned a tolerance value of zero unless explicit tolerances 
have been defined in the specification. The P-V Percent column gives the relative 
contribution of each tolerance value to the overall test accuracy. The Notes column 
explains various tolerance values. </p>

<hr />
<h3 id="Verification">VERIFICATION AND CERTIFICATION </h3>

<p>A publication by Arnold and Kestner, "Verification and Certification of CGH 
Aspheric Nulls", SPIE Vol. 2536, 117-126 (1995), describes verification and certification 
methods in some detail. Reprints are available from Diffraction International. 
</p>

<h4 id="Nikon">Nikon verification of registration </h4>
<p>The aperture locations of Nikon marks embedded in the CGH data and listed in 
the log file are measured by our photomask vendor and compared against design 
locations to verify the accuracy of the e-beam writing process. The Nikon report 
lists the X and Y deviations of each measurement point from the design locations. 
</p>

<h4 id="Substrate">Substrate interferograms before patterning </h4>
<p>To assure wavefront quality, we obtain transmission interferograms of our precision 
AR coated CGH substrates prior to chrome coating and patterning. For e-beam masters 
on photomask quality substrates, transmission interferograms before patterning 
are not available, transmitted wavefront is not specified by the manufacturer, 
and we must accept what we get. </p>

<p>Whenever tilt, power or reference are subtracted from an interferogram, this 
will be so indicated. Reference here refers to an empty cavity interferogram obtained 
before (or after) insertion of the CGH. By subtracting this reference, we obtain 
an absolute measure of the CGH substrate transmitted wavefront distortion, including 
wedge. </p>

<h4 id="TWD">Zero-order interferograms before phase etch </h4>
<p>We obtain zero order interferograms after patterning so that measured substrate 
aberrations can be registered to the clear aperture. We try to use a sufficiently 
long test cavity to walk any non-zero orders off the aperture, but for some CGHs 
this is not practical and the interferogram will contain transmitted or reflected 
diffraction ghosts over some portion of the aperture. In other respects, interferograms 
before and after patterning should agree since the transmitted wavefront distortion 
is unaffected by patterning. For chrome type CGHs, zero order transmission interferograms 
can be verified by the end user. </p>

<h4 id="RIE">Zero-order interferograms after phase etch </h4>
<p>For phase type CGHs, there is nominally no zero order and the transmitted wavefront 
distortion cannot be measured in the usual manner. Diffraction International therefore 
obtains transmission interferograms of phase etched CGHs with the chrome etch 
mask still in place. The effective substrate transmitted wavefront distortion 
(for any but zero order diffraction) is the average of this interferogram and 
one obtained prior to phase etching. If the phase etched and chrome masked interferogram 
cannot be obtained because of diffraction ghosts, we will estimate the transmitted 
wavefront distortion from the unpatterned substrate interferogram and an assumed 
etch depth uniformity. </p>

<p>When a fiducialized interferogram of the patterned substrate prior to phase 
etch is available, we will average this with the post phase etch interferogram 
to best represent the effective wavefront distortion. We may also subtract the 
pre phase etch interferogram from the post phase etch interferogram to obtain 
a measurement of the etch depth uniformity. </p>

<h4 id="Framing">Framing certification </h4>
<p>Diffraction International measures the location and orientation of each CGH 
in its frame using an alignment fixture. Frame alignment is important only if 
it must be transferred from one CGH to another (<i>e.g.</i> HA50 Series Alignment CGH 
to custom CGH null). The reported decenters and tilts follow the OSLO notation 
and are defined in the coordinate diagram which follows. The plane of the CGH 
face relative to the frame balls is measured in an absolute sense. Alignment in 
the plane of the CGH is relative to the alignment fixture and includes a small 
bias error common to all CGHs. </p>

<p>The user can verify relative framing errors with ordinary metrology tools commonly 
available in the optics lab. The CGH should be oriented to contact the CGH mount 
using the three tooling balls nearest the key notch. Relative TLA and TLB are 
easily measured using your interferometer or an autocollimator to observe zero 
order reflection off the CGH face. Relative DCZ can be measured with a dial gauge 
contacting the center of the CGH face. Absolute TLA, TLB and DCZ can be measured 
similarly by resting the CGH face up on a surface plate. Verification of DCX, 
DCY and TLC require viewing of the CGH fiducial marks. For Model 50R and Model 
50 frames, these are located at the four corners of a 30 mm square centered on 
the CGH. We use the two marks along the lower edge of the frame. Use a microscope 
with crosshair to focus on a fiducial mark and then replace the CGH, noting the 
apparent change in location of the fiducial mark. Repeat for the second fiducial 
mark. Placing the CGH face up on an abrasive surface might wear flats on the frame 
balls, affecting the measured values of TLA, TLB and DCZ relative to a reference 
flat. Such wear will not degrade performance since these wear points are not the 
points which contact the CGH kinematic mount. </p>

<hr />
<h3 id="Appendices">ELECTRONIC APPENDICES (CDROM) </h3>

<h4 id="OSLO">OSLO lens files (filename.osl and filename.dbl.osl) </h4>
<p>Null tests are designed in single pass starting at the return surface (usually 
the asphere) and ending with a focused or collimated wavefront. To create a wavefront 
perpendicular to the return surface, the medium preceding this surface is assigned 
a refractive index of 1E-20. The CGH is modeled as two superimposed surfaces. 
The "CGH Phase" surface is a polynomial diffractive surface. The "CGH Carrier" 
surface is an HOE type surface, as produced by recording the interference of two 
point sources. Source 2 represents the spherical or collimated wavefront from 
the interferometer whereas Source 1 represents the diffracted carrier. Boundary 
drawing information is included to indicate the orientation of the CGH frame. 
OSLO can model any type of aperture using Boolean combinations of simple apertures. 
The CGH aperture is placed on the "CGH Phase" surface and modeled as the intersection 
of a circle or ellipse and a rectangle. </p>

<p>The double pass file is constructed automatically from the single pass file 
using a proprietary .CCL program. The double pass file uses global coordinates 
and pickups to tie the return surfaces to the outbound surface. Surface 1 is usually 
the CGH Face, so global coordinates are the same as CGH coordinates. The field 
point which we have defined corresponds to the real or virtual cat's eye focus 
location or, in the case of afocal configurations, the direction from which a 
collimated test wavefront is incident. Because we use a right handed coordinate 
system with x to the right and y at the top as seen from the interferometer, the 
double pass model is "strange" with outbound rays propagating along the negative 
z axis. Consequently, diffraction orders are inverted compared to the single pass 
model. </p>

<h4 id="ZEMAX">ZEMAX lens files (filename.zmx and filename.dbl.zmx) </h4>
<p>These files are translated from the OSLO lens files by a proprietary .CCL program. 
Some features, particularly complex apertures, may not translate correctly, resulting 
in bad wavefront statistics due to rays which should have been blocked. Also, 
Focus Software has only recently released some upgrades to ZEMAX which allow it 
to handle a larger number of polynomial coefficients and to properly treat the 
zero index initial medium in the case of decentered pupils. If this file generates 
errors, make sure you are using the most recent version of ZEMAX. </p>
<h4 id="CodeV">CODE V lens sequence files (filename.seq and filename.dbl.seq) 
</h4>
<p>These files are translated from the OSLO lens files by a proprietary .CCL program. 
The sequence file also draws the lens and executes a wavefront analysis. Some 
features, particularly complex apertures, may not translate correctly. Other limitations 
of CODE V may prevent translation of one or both files. In particular, CODE V 
does not support the near zero index medium which we use in modeling all single 
pass, center of curvature tests. Also, CODE V is unable to handle more than a 
10th order phase polynomial on non-rotational HOE surfaces, a 20th order polynomial 
on rotational HOE surfaces, or long file names. If an interferogram file (.INT) 
is used to describe the CGH phase function, then the absolute pathname to this 
file will be specified in the .seq file and you will need to edit it to match 
your directory structure. </p>

<h4 id="DXF">AutoCAD DXF double-pass lens file (filename.dbl.dxf) </h4>
<p>This is the OSLO double pass lens file as exported by the OSLO "dxf_lens_drawing" 
command. The CGH frame boundary drawing information is included to indicate the 
frame orientation. Circular arcs are approximated by piecewise linear polylines. 
</p>

<h4 id="HoloMask">HoloMask log files (*.log) </h4>
<p>These log files are produced by Diffraction International's HoloMask and related 
software used to encode and digitize the CGH pattern. The log files begin with 
parameters defining the CGH phase function and aperture. These parameters are 
exported from OSLO and should exactly match equivalent parameters of the OSLO 
lens file. HoloMask log files may include a CGH phase table matching that generated 
by OSLO. HoloMask will list the magnitude and aperture location of any and all 
encoding errors which, upon digitization, could possibly exceed thresholds specified 
by the encoding parameters. A list of encoding errors does not signify a problem 
unless the reported magnitudes are unacceptable. The DXB to MEBES conversion log 
file lists the aperture locations of fiducial marks used to align the CGH and 
of Nikon marks used to verify the registration accuracy of the e-beam writing. 
Finally, a MEBES to AutoCAD DXB conversion utility extracts a list of fringe edges 
and optionally generates test plots. </p>

<h4 id="EdgeChk">EdgeChk verification of encoding and digitization (*.log) 
</h4>
<p>The list of fringe edges extracted from the digitized MEBES data is compared 
against the computed phase values at sampled points on those edges to verify the 
accuracy of the encoding and digitization process. Aperture sample points are 
grouped into rectangular cells of a size approximating one pixel of the interferometer 
camera. Statistics are reported by sample point and by sample group. The point 
sample statistics are appropriate for an infinite spatial resolution interferogram 
whereas the group sample statistics are appropriate for a video resolution interferogram. 
</p>

<h4 id="TolXLS">Tolerance analysis spreadsheet (jobnumber.xls) </h4>
<p>This EXCEL file is an electronic version of the printed tolerance analysis. 
Use it to do your own what-if analyses. </p>

<h4 id="OPD">Durango interferogram data files (*.opd) </h4>
<p>These are the electronic interferogram data files from which the printed interferogram 
documentation was derived. </p>

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